External Circuit Effects on High-Speed ADC Inputs
نویسنده
چکیده
The high-speed analog-to-digital converters (ADC) that convert an analog signal voltages into binary coded signals at sampling rates greater than 1 Msample/s have been in fast development and are being widely used in many advanced systems in communications, measurements and image processes. These systems are continuously creating a great demand on the speed and resolution of the ADCs to improve the system quality and hardware complexity. For example, an image processing system requires an ADC having 12-bit resolution or better at sampling rate above 60 Msample/s to achieve a good signalto-noise ratio (SNR) and linearity. A measurement system requires an ADC having not only high SNR but also a good spurious free dynamic range (SFDR) at high dynamic sampling speeds to maintain high accuracy and flexibility of the measurement.
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